これまでに得られた結果と同様に，5CB/S_Nap6/CD 混合系と5

これまでに得られた結果と同様に，5CB/S_Nap6/CD 混合系と5CB/R6/CD 混合系とも
にCD 濃度が上昇するにつれてらせんピッチが減少することがわかった。今回は欠陥線
が観察されたサンプルのみしからせんピッチの算出ができなかったが，Figure 1, 2 のセ
ルの様子とあわせてらせんピッチから算出できる選択反射波長とと選択反射の色がお
およそ一致すると考えた。

ผลลัพธ์ (อังกฤษ) 1:

As well as on the results obtained so far, 5CB/R6/CD and 5CB/S_Nap6/CD mixtures and mixturesTo found the reduced spiral pitch CD concentration increases. This is the fault lineCould not calculate the pitch not catch samples were observed only, shown in Figure 1, set of 2Choose reflection wavelength of Le and also can be calculated from the pitch and choose reflective colors youAbout considered to match.

ผลลัพธ์ (อังกฤษ) 2:

Similar to the results obtained so far, 5CB / S_Nap6 / CD mixed system and 5CB / R6 / CD mixed system both
helical pitch was found to decrease as CD concentration is increased. This time defect line
but were unable to calculate the helical pitch only a sample that has been observed, Figure 1, 2 of the cell
appearance and color of the selective reflection and the selective reflection wavelength can be calculated from the helical pitch together Le our
I thought that approximately matches.

ผลลัพธ์ (อังกฤษ) 3:

Similar to the results obtained so far and also ， CB R 6 CD mixture 5 and 5 or 6 -- CB S Nap CD mixturesIt decreases with the increase in the concentration CD when the helical pitch. This fault lineIt was observed that the helical pitch of the sample is calculated not only can ， Figure, 1 of 2Along with the appearance of the selective reflection and the selective reflection wavelength can be calculated from the helical pitch colorThinking about the match.